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W01.T2 Technical Session 2 - Testing

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Session End
Moderator
Melanie Schillinsky, NXP, Germany
Presentations

W01.T2.1 Perception and Reality Check into V-Stress for Screening Defective Parts in Automotive Reliability

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End
Speaker
Lieyi Sheng, onsemi, Belgium

W01.T2.2 Power Cycling Body Diode Current Flow on SiC MOSFET Device

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End
Speaker
Giovanni Corrente, STMicroelectronics, Italy

W01.T2.3 Reducing Routing Overhead using Natural Loops

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End
Speaker
Tobias Kilian, TU Munich / Infineon Technologies AG, Germany

W01.T2.4 A Novel Method for Discovering Electrically Equivalent Defects in Analog/Mixed-Signal Circuits

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End
Speaker
Mayukh Bhattacharya , Synopsys, United States